E-MRS Spring Meeting 1999, Symposium P

Session IV : Nonlinear, time-resolved, spacially resolved techniques

Wednesday Afternoon - 2
 
 
  First Autor Title Where from ?
16.30-17.00 Pahlke, D. (invited) SCANNING NEAR-FIELD OPTICAL MICROSCOPY ON III-V NANOSTRUCTURES  <abstract>  Berlin/Germany
17.00-17.30 Schillinger, (invited) Characterization of SiC MBE layers and polytypes by SHG in reflection <abstract>  Jena/Germany
       
17.30-17.45 Lee, Y.-S. Fourth-order nonlinear spectroscopy of semiconductor interfaces Austin/ Tex/ USA
17.45-18.00 Pedersen, T.G. Second-harmonic generation studies of Au and Ag films on  Si(111) Aalborg, Denmark
18.00-18.15 Schumacher, D. Optical second-harmonic phase spectroscopy of the Si(111)-SiO2 interface. Goettingen/Germ
18.15-18.30 Aktsipetrov, O.A. Nonlinear optical diagnostics of Si-SiO2 buried interfaces: DC-electric field induced second, third, and forth harmic generation in MOS structrues Moscow/Russia
18.30-18.45 Bobek, T. Sensitivity of SHG on oxide depostion process parameters Aachen/Germany
Poster:      
  Gruzdeva, A.S. Two-beam nonlinerar optical technique for characterization of surface roughness St.Petersburg/Russ
  Niedermeier, S. Nonlinear optical properties of SiC Jena/ Germany
  Haag, H. Carrier relaxation dynamics in gallium nitride layers Strasbourg/France
  Grivickas, V. Spatially and time-resolved infrared absorption for optical and electronic characterization of indirect band gap semiconductors  Vilnius, Lithuania
  Mizeikis, V. Nondestructive optical  characterization of the surface reion in bulk semiconductors and heterostructures Vilnius, Lithuania
  Derbali, M.B. Time resolved photoluminescence photoluminescence of homo- and hetero-epitaxial layers of InP grown on GaAs substrates Monastir/Tunisia
  Timoshenko, V.Yu. Photoluminescence characterization of non-radiative defect density on silicon surfaces and interfaces at room temperature Garching/Germany
  Semchuk, O.Yu. The peculiarities of optical properties of ferromagnetic semiconductor with dynamical grating on hot electrons Kyiv/Ukraine
  Bivol, V. Photoinduced surface microdeformations of chalco-genide semiconductros: mechanism and applications Chisinau, Moldov